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Device In Situ Observation Evaluation Method
Observing the device in the exact same conditions and setting in which the device was used. (Food and Drug Administration)
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Device problems that occur due to the presence of a material that should not be present or part of the device. …
Device problems associated with the improper combination of materials or elements present in the device (e.g., improper composition of the materials of…
Testing the resistance to current flow in a device's circuit or component.
A device that experienced problems due to insufficient or excessive resistance to AC current flow either by the device or circuit. …
Testing the device's response to a suddenly applied stress. The test ascertains whether the material is tough or brittle.
Testing the device for adequate immunity or capability to resist electromagnetic interference (EMI).
